DOI: Journal: Aftab, K., Fatima, H.S., Aziz, N., Baig, E., Khurram, M., Mubarak, F. and Enam, S.A., 2021, October. Machine learning and sampling techniques to enhance radiological di2021 International Conference on Engineering and Emerging Technologies (ICEET) IEEE. Year: 2021 Authors: Kiran Aftab, Hafiza Sundus Fatima, Namrah Aziz, Erum Baig, Muhammad Khurram, Fatima Mubarak, Syed Ather Enam
DOI: Journal: Journal of neuro-oncology Year: 2022 Authors: Kiran Aftab, Faiqa Binte Aamir, Saad Mallick, Fatima Mubarak, Whitney B Pope, Tom Mikkelsen, Jack P Rock, Syed Ather Enam